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Encyclopedia :
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SI :
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SILC (semiconductors) |
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SILC (semiconductors)Stress Induced Leakage Current is a leakage current due to material defects created by stress in the gate oxide of a MOSFET. This is a common term in semiconductor physics.
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This article is from Wikipedia. All text is available under the terms of the GNU Free Documentation License. |
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| © 2008 Chamas Enterprises Inc. |
